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looks to me like we need some measurements to establish:
- (if/by how much) charge spreads laterally from full pixels
- how much light scattering there is from microlenses/coverglass etc.
anyone ever seen anything on any such measurements or how to do them? I found one paper on measuring charge diffusion in back illuminated pixels with a scanning laser, but we really need something that can be done without an optics lab.
It would be nice to know how much the star size is determined by the optics and how much by the detector - could help inform purchase decisions, particularly since the latest BSI chips may well lack the potential barriers that prevent lateral charge diffusion in FSI chips.
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